| 000 | 01030cam a22002654a 4500 | ||
|---|---|---|---|
| 005 | 20230526160049.0 | ||
| 008 | 020626s2002 nyua 001 0 eng | ||
| 010 | _a 2002009966 | ||
| 020 | _a0471250376 | ||
| 040 |
_aDLC _cDLC _dDLC |
||
| 042 | _apcc | ||
| 050 | 0 | 0 |
_aQA76.76.T48 _bF56 2002 |
| 082 | 0 | 0 |
_a005.14 _bFIN-B |
| 100 | 1 |
_aFine, Michael, _d1966- |
|
| 245 | 1 | 0 |
_aBeta testing for better software / _cMichael Fine. |
| 260 |
_aNew York, NY : _bWiley Technology Pub., _cc2002. |
||
| 300 |
_axix, 284 p. : _bill. ; _c24 cm. |
||
| 650 | 0 |
_aComputer software _xTesting. |
|
| 856 | 4 | 2 |
_3Contributor biographical information _uhttp://www.loc.gov/catdir/bios/wiley044/2002009966.html |
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/description/wiley037/2002009966.html |
| 856 | 4 | 1 |
_3Table of contents _uhttp://www.loc.gov/catdir/toc/wiley031/2002009966.html |
| 906 |
_a7 _bcbc _corignew _d1 _eecip _f20 _gy-gencatlg |
||
| 999 |
_c18541 _d18541 |
||